Abstract

Thin amorphous films of nominal composition Gd₂Fe₁₄B were fabricated on Si (100) substrates using ion‐beam sputtering for the purpose of establishing their structural and magnetic properties at room temperature. X‐ray‐diffraction scans performed on as‐deposited and annealed films revealed an amorphous structure. The as‐deposited saturation magnetization was found to be 8101 G at room temperature suggesting ferrimagnetic ordering with anti‐parallel coupling similar to other heavy rare earth‐transition metal systems. Results from in‐plane and perpendicular ferromagnetic resonance experiments conducted at 9.108 GHz showed the films to be inhomogeneous. This was evident from the presence of two in‐plane resonance lines and spin‐wave spectra that were not quadratic. Annealing at 300 °C for 30 min significantly reduced the absorption of the second in‐plane resonance and restored classical n² law spin‐wave behavior. It is speculated that the origin of the inhomogeneities is due to the kinetics of the deposition process where the increased mobility of the condensing Fe atoms leads to interspersed amorphous regions which are rich in Fe and Gd, respectively.

Notes

The following article appeared in Bushnell, S.E., Dorsey, P.C., Nowak, W.B., & Vittoria, C. (1993). Structural and magnetic characterization of amorphous Gd₂Fe₁₄B thin films. Journal of Applied Physics, 73(10), 6491-6493.

Keywords

amorphous materials

Disciplines

Industrial Engineering | Mechanical Engineering

Publisher

American Institute of Physics

Publication Date

5-15-1993

Rights Information

Copyright 1993 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Rights Holder

American Institute of Physics


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