Magnetically soft amorphous films of FeₓCo₈₀₋ₓB₁₅Si₅ (x = 0, 6, 23, 40, 70, 80) were ion beam sputter deposited onto fused quartz for static and microwave magnetic characterization. Films ranged in thickness from 220 to 260 nm and were deposited at rates of 0.1-0.2 nm/s. Saturation magnetization, coercivity, and loop squareness values were extracted from hysteresis loops generated by a vibrating sample magnetometer. Ferromagnetic resonance measurements were taken using a 9.5-GHz cavity with the applied magnetic field both parallel and perpendicular to the plane of the film, yielding values for the g factor, anisotropy field, effective magnetization, and linewidth. Well resolved quadratic spin-wave resonance spectra allowed for the deduction of exchange stiffness constants. Hysteresis loops showed well-defined uniaxial in-plane anisotropies for Fe-rich films, with easy axis loop squareness decreasing with decreasing Fe content. Saturation magnetization and effective magnetization values were found to reach a maximum at x = 70 for those compositions investigated. These films were found to have soft magnetic properties comparable to the FeₓCo₈₀₋ₓB₁₅Si₅ alloy films previously investigated.


The following article appeared in Harris, V.G., Oliver, S.A., Nowak, W.B., & Vittoria, C. (1990). Magnetic and microwave properties of ion-beam-sputtered amorphous FeₓCo₈₀₋ₓB₁₅Si₅ films. Journal of Applied Physics, 67(9), 5571-5573.


amorphous ferromagnetic alloys, reflection electron diffraction


Industrial Engineering | Mechanical Engineering


American Institute of Physics

Publication Date


Rights Information

Copyright 1990 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.

Rights Holder

American Institute of Physics

Click button above to open, or right-click to save.