Abstract
Hexagonal BaFe₁₂O₁₉ ferrite films, having thicknesses ranging from 200-500μm, were prepared by a screen printing process followed by sintering heat treatments. Structural, magnetic, and microwave measurements confirmed that the polycrystalline films were suitable for applications in self-biasing microwave devices in that they exhibited a large remanence (4πMr=3800 G), high hysteresis loop squareness (Mr/Ms=0.96) and low microwave loss. A derivative linewidth ΔH of 310 Oe was measured at 55.6 GHz. This represents the lowest ΔH measured in polycrystalline hexaferrite materials. ΔH can be further improved by reducing porosity and improving the c-axis orientation of grains in polycrystalline ferrite.
Keywords
hexagonal ferrite films, oriented barium hexaferrite, BaFe₁₂O₁₉, polycrystalline films, remanence, hysteresis loop squareness
Subject Categories
Thick films, Ferromagnetic resonance, Screen process printing, Sintering
Disciplines
Electromagnetics and photonics
Publisher
American Institute of Physics
Publication Date
2-6-2006
Rights Information
Copyright 2006 American Institute of Physics.
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
Chen, Y. J.; Sakai, T.; Chen, T. Y.; Yoon, S. D.; Geiler, A. L.; Vittoria, C.; and Harris, V. G., "Oriented barium hexaferrite thick films with narrow ferromagnetic resonance linewidth" (2006). Electrical and Computer Engineering Faculty Publications. Paper 99. http://hdl.handle.net/2047/d20002270
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oriented_barium_figure_4.ppt (32 kB)
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oriented_barium_figure_1.ppt (25 kB)Figure 1
oriented_barium_figure_2.ppt (50 kB)
Figure 2
oriented_barium_figure_3.ppt (23 kB)
Figure 3
oriented_barium_figure_4.ppt (32 kB)
Figure 4
Notes
Originally published in Applied Physics Letters 88, 062516 (2006). DOI:10.1063/1.2173240 (http://dx.doi.org/10.1063/1.2173240).