Abstract
The properties of thick BaScₓFe₁₂₋ₓO₁₉ (0.3 < x < 0.6) scandium hexaferrite films were measured by static and microwave field techniques. Films were deposited by pulsed laser ablation onto c-plane sapphire at oxygen pressures of 20 and 50 mTorr. Vibrating sample magnetometer measurements as corroborated by x-ray data showed that the films below 3 μm had easy axis of magnetization (c-axis) normal to the film plane with saturation magnetization values of 3.0-3.8 kG. From the ferrimagnetic resonance frequency versus external magnetic field, we deduced a g value of 1.96 ± 0.03 and uniaxial anisotropy field of similar to 10 kOe. The ferrimagnetic resonance linewidth for the film thicker than 5μm was maximum at 32 GHz and decreased with increasing frequency, indicating evidence for nonuniform magnetic field scattering internally. However, the linewidths were lower for films having thickness below 3 μm.
Keywords
scandium hexaferrite films, BaScₓFe₁₂₋ₓO₁₉, microwave field techniques, static techniques
Subject Categories
Thick films, Laser ablation, Ferromagnetic resonance
Disciplines
Electromagnetics and photonics
Publisher
American Institute of Physics
Publication Date
5-1-2000
Rights Information
Copyright 2000 American Institute of Physics.
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
shi, P.; Yoon, S. D.; Zuo, X.; Kozulin, I.; Oliver, S. A.; and Vittoria, C., "Microwave properties of pulsed laser deposited Sc-doped barium hexaferrite films" (2000). Electrical and Computer Engineering Faculty Publications. Paper 89. http://hdl.handle.net/2047/d20002260
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Notes
Originally published in Journal of Applied Physics 87, 4981 (2000). DOI:10.1063/1.373222 (http://dx.doi.org/10.1063/1.373222).