Abstract
We report on a new technique for the determination of the linear magnetostriction constant of thin films. The technique uses the shift in ferromagnetic resonance (FMR) of a magnetostrcitive sample upon application of an external stress. A circular thin film is deposited onto a fused quartz place by ion beam sputter deposition. The place is mounted in a cantilever configuration, with the film suspended over the junction of a slot-line/coplanar guided structure. The slot line proved a rf magnetic field normal to the film place, tunable over the frequency range 0.1 GHz
Keywords
linear magnetostriction constant, slot line, FMR, fused quartz, ion beam sputter deposition
Subject Categories
Thin films, Ferromagnetic resonance, Magnetostriction, Magnetic fields
Disciplines
Electromagnetics and photonics
Publisher
American Institute of Physics
Publication Date
5-1-1990
Rights Information
Copyright 1990 American Institute of Physics.
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
Oliver, S. A.; Harris, V. G.; and Vittoria, C., "Magnetostriction measurements on thin-films by a slot-line ferromagnetic-resonance technique" (1990). Electrical and Computer Engineering Faculty Publications. Paper 79. http://hdl.handle.net/2047/d20002250
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Notes
Originally published in Journal of Applied Physics 67, 5019 (1990). DOI:10.1063/1.344709 (http://dx.doi.org/10.1063/1.344709).