Abstract

We report on a new technique for the determination of the linear magnetostriction constant of thin films. The technique uses the shift in ferromagnetic resonance (FMR) of a magnetostrcitive sample upon application of an external stress. A circular thin film is deposited onto a fused quartz place by ion beam sputter deposition. The place is mounted in a cantilever configuration, with the film suspended over the junction of a slot-line/coplanar guided structure. The slot line proved a rf magnetic field normal to the film place, tunable over the frequency range 0.1 GHz

Notes

Originally published in Journal of Applied Physics 67, 5019 (1990). DOI:10.1063/1.344709 (http://dx.doi.org/10.1063/1.344709).

Keywords

linear magnetostriction constant, slot line, FMR, fused quartz, ion beam sputter deposition

Subject Categories

Thin films, Ferromagnetic resonance, Magnetostriction, Magnetic fields

Disciplines

Electromagnetics and photonics

Publisher

American Institute of Physics

Publication Date

5-1-1990

Rights Information

Copyright 1990 American Institute of Physics.

Rights Holder

American Institute of Physics

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