The evolution of magnetic properties and local atomic ordering during thermal annealing has been studied for amorphous Fe₇₅Ni5B₁₅Si₅ thin films. Resistivity, vibrating sample magnetometer (VSM), ferromagnetic resonance (FMR), extended x-ray absorption fine structure (EXAFS), and Mossbauer effect (ME) measurements were taken on samples annealed at various temperatures ranging to film crystallization. The as-deposited samples are in a close-packed structure with little short-range order. Samples annealed above 200°C show ordering of the boron shell, but no indication of long-range ordering. With the exception of the anisotropy and coercive fields, no change in the magnetic or microwave magnetic parameters is observed for these samples prior to crystallization. Samples annealed above 400°C show indications of crystallization for all measurements.


Originally published in Journal of Applied Physics 70, 5852 (1991). DOI:10.1063/1.350134 (http://dx.doi.org/10.1063/1.350134).


resistivity, vibrating sample magnetometer (VSM), FMR, extended x-ray absorption fine structure (EXAFS), Mossbauer effect (ME) measurements, amorphous Fe₇₅Ni5B₁₅Si₅ films, thermal annealing, local atomic ordering

Subject Categories

Magnetic properties, Ferromagnetic resonance


Electromagnetics and photonics


American Institute of Physics

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Copyright 1991 American Institute of Physics.

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American Institute of Physics

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