Abstract

The evolution of magnetic properties and local atomic ordering during thermal annealing has been studied for amorphous Fe₇₅Ni5B₁₅Si₅ thin films. Resistivity, vibrating sample magnetometer (VSM), ferromagnetic resonance (FMR), extended x-ray absorption fine structure (EXAFS), and Mossbauer effect (ME) measurements were taken on samples annealed at various temperatures ranging to film crystallization. The as-deposited samples are in a close-packed structure with little short-range order. Samples annealed above 200°C show ordering of the boron shell, but no indication of long-range ordering. With the exception of the anisotropy and coercive fields, no change in the magnetic or microwave magnetic parameters is observed for these samples prior to crystallization. Samples annealed above 400°C show indications of crystallization for all measurements.

Notes

Originally published in Journal of Applied Physics 70, 5852 (1991). DOI:10.1063/1.350134 (http://dx.doi.org/10.1063/1.350134).

Keywords

resistivity, vibrating sample magnetometer (VSM), FMR, extended x-ray absorption fine structure (EXAFS), Mossbauer effect (ME) measurements, amorphous Fe₇₅Ni5B₁₅Si₅ films, thermal annealing, local atomic ordering

Subject Categories

Magnetic properties, Ferromagnetic resonance

Disciplines

Electromagnetics and photonics

Publisher

American Institute of Physics

Publication Date

11-15-1991

Rights Information

Copyright 1991 American Institute of Physics.

Rights Holder

American Institute of Physics

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