Abstract
Ferromagnetic resonance measurements were taken on a 4 μm diam disk using a planar microwave transmission line device. The absorption modes of a sample placed on this devise can be measured by monitoring the microwave power transmitted across the device while a swept magnetic field varies the sample absorption through resonance. Results for the disk, which was etched from a 105 nm thick amorphous Fe₈₀B₁₅Si₅ film, followed the Kittel model over the frequency range from 2 to 20 GHz, in agreement with parameters measured on 5 mm diam disks by a microwave cavity. These results indicate the device has a sensitivity of 3x109 . ΔH spins, almost two orders of magnitude better than microwave cavity measurements.
Keywords
micrometer sized samples, absorption modes, swept magnetic fields, Fe₈₀B₁₅Si₅
Subject Categories
Ferromagnetic resonance, Microwave transmission lines, Thick films
Disciplines
Electromagnetics and photonics
Publisher
American Institute of Physics
Publication Date
5-19-1997
Rights Information
Copyright 1997 American Institute of Physics.
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
Zhang, S.; Oliver, S. A.; Israeloff, N. E.; and Vittoria, C., "High-sensitivity ferromagnetic resonance measurements on micrometer-sized samples" (1997). Electrical and Computer Engineering Faculty Publications. Paper 60. http://hdl.handle.net/2047/d20002231
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Notes
Originally published in Applied Physics Letters 70, 2756 (1997). DOI:10.1063/1.118974 (http://dx.doi.org/10.1063/1.118974).