Abstract

The magnetic, microwave, and the atomic structure properties of (Fe₀.₇Co₀.₃)1-xBx sputtered films on glass substrates were investigated. The addition of boron induced a decrease in coercivity and ferromagnetic resonance linewidth. The amorphous structure was formed at x ∽0.075. Extended x-ray absorption fine structure (EXAFS) of Fe and Co showed the reduced Fourier transform (FT) amplitude, and increased Debye-Waller factors as x was increased, indicating the increased disorder due to the thermal and structural displacements. Possible Fe-B bonding was observed with a reduced bond length, which indicates boron atoms' preference for staying in the interstitial sites in bcc unit cell.

Notes

Originally published in Journal of Applied Physics 103, 07E736 (2008). DOI:10.1063/1.2838226 (http://dx.doi.org/10.1063/1.2838226).

Keywords

thin films, ferromagnetism, microwave properties, Fe₀.₇Co₀.₃, 1-xBx, EXAFS, Fe, Co, Fourier transform amplitude, FT, Debye Waller factors, Fe-B bonding

Subject Categories

Thin films, Ferromagnetism, Magnetic properties, Atomic structure, Boron, Ferromagnetic resonance, Extended X-ray absorption fine structure

Disciplines

Electromagnetics and photonics

Publisher

American Institute of Physics

Publication Date

4-1-2008

Rights Information

Copyright 2008 American Institute of Physics.

Rights Holder

American Institute of Physics

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effects_of_boron_addition_fig1.zip (109 kB)
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effects_of_boron_addition_fig2.zip (192 kB)
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effects_of_boron_addition_fig3.zip (68 kB)
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