Title
Cation engineering of Cu-ferrite films deposited by alternating target laser ablation deposition
Abstract
Epitaxial copper ferrite thin films were deposited on MgO substrates by the alternating target laser ablation deposition method. A series of films was studied to explore the impact of oxygen operating pressure, substrate temperature, and the ratio of laser shots incident on each target upon the magnetic, structural, and atomic structural properties. The highest saturation magnetization, 2800 G, was achieved at a 90 mTorr oxygen pressure and at 650 degrees C for the substrate temperature. This value is 65% higher than the room temperature magnetization for bulk equilibrium samples. The inversion parameter was measured by extended x-ray absorption fine structure analysis. The sample having the highest saturation magnetization had a corresponding inversion parameter (percentage of Cu ion octahedral site occupancy) of 51.5% compared with the bulk value of 85%.
Keywords
alternating target laser ablation deposition, ATLAD method, epitaxial copper ferrite, MgO substrates, saturation magnetization, inversion parameter
Subject Categories
Laser ablation, Pulsed laser deposition, Thin films, Extended X-ray absorption fine structure
Disciplines
Electromagnetics and photonics
Publisher
American Institute of Physics
Publication Date
4-1-2008
Rights Information
Copyright 2008 American Institute of Physics.
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
Yang, Aria; Chen, Zhaohui; Islam, Shaheen M.; Vittoria, Carmine; and Harris, V. G., "Cation engineering of Cu-ferrite films deposited by alternating target laser ablation deposition" (2008). Electrical and Computer Engineering Faculty Publications. Paper 28. http://hdl.handle.net/2047/d20002198
Figure 1
cation_engineering_fig2.zip (65 kB)
Figure 2
cation_engineering_fig3.zip (47 kB)
Figure 3
cation_engineering_fig4.zip (348 kB)
Figure 4
cation_engineering_fig5.zip (47 kB)
Figure 5
Click button above to open, or right-click to save.
Additional Files
cation_engineering_fig1.zip (15 kB)Figure 1
cation_engineering_fig2.zip (65 kB)
Figure 2
cation_engineering_fig3.zip (47 kB)
Figure 3
cation_engineering_fig4.zip (348 kB)
Figure 4
cation_engineering_fig5.zip (47 kB)
Figure 5
Notes
Originally published in Journal of Applied Physics 103, 07E509 (2008). DOI:10.1063/1.2837646 (http://dx.doi.org/10.1063/1.2837646).