Abstract
Hexagonal barium ferrite (BaFe₁₂O₁₉) thin films were grown at the atomic scale by alternating target laser ablation deposition (ATLAD) of orthorhombic BaFe₂O₄ and rhombohedral α-Fe₂O₃ on < 001 > Al₂O₃ substrates. Crystallographic, magnetic, and microwave properties of the ATLAD films were determined to be comparable with single crystal quality bulk and films of BaFe₁₂O₁₉ produced by other techniques. The ability to deposit high quality hexagonal ferrite thin films by utilizing multiple targets of different chemical compositions in the deposition routine provides unique opportunities to control the ionic distribution in the unit cell of this important class of ferrite materials.
Keywords
hexagonal barium ferrite, BaFe₁₂O₁₉, BaFe₂O₄, α-Fe₂O₃, ATLAD, Al₂O₃ substrates, crystallographic properties, microwave properties
Subject Categories
Thin films, Laser ablation, Pulsed laser deposition, Magnetic properties
Disciplines
Electromagnetics and photonics
Publisher
American Institute of Physics
Publication Date
10-15-2007
Rights Information
Copyright 2007 American Institute of Physics.
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
Geiler, A. L.; Yoon, S. D.; Chen, Y.; Chinnasamy, C. N.; Chen, Z.; Geiler, M.; Harris, V. G.; and Vittoria, C., "BaFe₁₂O₁₉ thin films grown at the atomic scale from BaFe₂O₄ and α-Fe₂O₃ targets" (2007). Electrical and Computer Engineering Faculty Publications. Paper 24. http://hdl.handle.net/2047/d20002194
Figure 1
bafe12o19_fig2.zip (13 kB)
Figure 2
bafe12o19_fig3.zip (21 kB)
Figure 3
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Additional Files
bafe12o19_fig1.zip (62 kB)Figure 1
bafe12o19_fig2.zip (13 kB)
Figure 2
bafe12o19_fig3.zip (21 kB)
Figure 3
Notes
Originally published in Applied Physics Letters 91, 162510 (2007). DOI:10.1063/1.2800890 (http://dx.doi.org/10.1063/1.2800890).