Abstract

The deposition and characterization of thick M-type barium hexaferrite (BaFe₁₂O₁₉) films produced by a modified liquid phase epitaxy deposition technique are reported. The films are deposited on (111) oriented single crystal garnet (Gd₃Ga₅O₁₂) substrates. The thickness of the films ranged between 45 and 80 μm with growth rates of up to 40 μm/h. This growth rate is about five times greater than films grown on substrates of (111) magnesium oxide. Although the films are relatively thick, the ferrimagnetic resonance linewidth is remarkably narrow.

Notes

Originally published in Journal of Applied Physics 96, 2131 (2004). DOI:10.1063/1.1769597 (http://dx.doi.org/10.1063/1.1769597).

Keywords

m-type barium hexaferrite films, single crystal garnet substrates, BaFe₁₂O₁₉

Subject Categories

Thick films, Epitaxy, Ferromagnetic resonance

Disciplines

Electromagnetics and photonics

Publisher

American Institute of Physics

Publication Date

8-18-2004

Rights Information

Copyright 2004 American Institute of Physics.

Rights Holder

American Institute of Physics



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