Abstract

Epitaxial thin films of barium hexaferrite (BaFe₁₂O₁₉) have been fabricated by the pulsed laser deposition technique on basal plane sapphire. Structural studies reveal the films to be predominantly single phase and crystalline, with the c axis oriented perpendicular to the film plane. The magnetic parameters deduced from vibrating sample magnetometer and ferromagnetic resonance (FMR) measurements are close to the parameters associated with bulk materials. Post annealing of the films reduced the FMR linewidth by more than a factor of 3 so that it compares reasonably well with single-crystal films. The derivative FMR linewidth was measured to be 66 Oe at 58 GHz and 54 Oe at 86 GHz. Spin-wave-like modes have been observed for the first time in barium ferrite films. The deduced exchange stiffness constant of 0.5 x 10-6 ergs/cm is in reasonable agreement with recent calculations.

Notes

Originally published in Journal of Applied Physics 71, 5107 (1992). DOI:10.1063/1.350614 (http://dx.doi.org/10.1063/1.350614).

Keywords

barium hexaferrite, epitaxial films, BaFe₁₂O₁₉

Subject Categories

Pulsed laser deposition, Thin films, Ferromagnetic resonance

Disciplines

Electromagnetics and photonics

Publisher

American Institute of Physics

Publication Date

5-15-1992

Rights Information

Copyright 1992 American Institute of Physics.

Rights Holder

American Institute of Physics

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