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<title>Center for Nano and Microcontamination Control Proposals</title>
<copyright>Copyright (c) 2013 Northeastern University All rights reserved.</copyright>
<link>http://iris.lib.neu.edu/cnmc_proposals</link>
<description>Recent documents in Center for Nano and Microcontamination Control Proposals</description>
<language>en-us</language>
<lastBuildDate>Tue, 21 May 2013 16:18:42 PDT</lastBuildDate>
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<title>The transport of contaminants in thin film deposition processes</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/9</link>
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<pubDate>Wed, 25 Jul 2012 12:49:11 PDT</pubDate>


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<author>John Cipolla</author>


<category>Surface contamination</category>

<category>Thin films</category>

</item>









<item>
<title>Physical cleaning of submicron trenches, a modeling study</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/8</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/8</guid>
<pubDate>Wed, 25 Jul 2012 12:45:29 PDT</pubDate>


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<author>Ahmed A. Busnaina</author>


<category>Surface contamination</category>

</item>









<item>
<title>Nano and microscale particle removal</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/7</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/7</guid>
<pubDate>Wed, 25 Jul 2012 12:42:30 PDT</pubDate>


	<description>
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<author>Ahmed A. Busnaina</author>


<category>Particles</category>

<category>Acoustic streaming</category>

</item>









<item>
<title>Particle adhesion and removal for post-CMP applications</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/6</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/6</guid>
<pubDate>Wed, 25 Jul 2012 12:39:36 PDT</pubDate>


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<author>George G. Adams</author>


<category>Particles</category>

<category>Chemical mechanical planarization</category>

</item>









<item>
<title>Development of a MEMs based micro gas analysis system</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/5</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/5</guid>
<pubDate>Wed, 25 Jul 2012 12:33:57 PDT</pubDate>


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	</description>


<author>Nicol E. McGruer</author>


<category>Gases - Analysis</category>

<category>Microelectromechanical systems</category>

</item>









<item>
<title>Establishing an IUCRC center for microcontamination control at Northeastern University: a planning meeting proposal</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/4</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/4</guid>
<pubDate>Wed, 25 Jul 2012 12:27:31 PDT</pubDate>


	<description>
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<author>Northeastern University - Center for Nano and Microcontamination Control</author>


<category>Contamination (Technology)</category>

</item>









<item>
<title>Techniques for finding and characterizing defects and contaminants</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/3</link>
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<pubDate>Wed, 25 Jul 2012 12:20:49 PDT</pubDate>


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<author>Nathan E. Israeloff</author>


<category>Surfaces (Technology) - Analysis</category>

<category>Surfaces (Technology) - Defects</category>

<category>Surface contamination</category>

</item>









<item>
<title>The removal of submicron particles using CO2 aerosol with emphasis on post-CMP applications</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/2</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/2</guid>
<pubDate>Wed, 25 Jul 2012 12:09:06 PDT</pubDate>


	<description>
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	</description>


<author>Ahmed A. Busnaina</author>


<category>Chemical mechanical planarization</category>

<category>Surfaces (Technology)</category>

</item>









<item>
<title>The mechanics of CMP and post-CMP cleaning</title>
<link>http://iris.lib.neu.edu/cnmc_proposals/1</link>
<guid isPermaLink="true">http://iris.lib.neu.edu/cnmc_proposals/1</guid>
<pubDate>Wed, 25 Jul 2012 12:03:59 PDT</pubDate>


	<description>
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<author>Sinan Müftü</author>


<category>Chemical mechanical planarization</category>

<category>Surfaces (Technology)</category>

</item>





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