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<description>Recent documents in Center for Nano and Microcontamination Control Presentations</description>
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<title>Division of Technology Transfer</title>
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<author>Center for Nano and Microcontamination Control, Northeastern University</author>


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<title>Particle Adhesion and Removal in Post-CMP Applications</title>
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<author>George G. Adams</author>


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<title>Nano and Microscale Particle Removal</title>
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<pubDate>Wed, 25 Jul 2012 13:14:59 PDT</pubDate>


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<author>Ahmed Busnaina</author>


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<title>The Mechanics of CMP and Post-CMP Cleaning</title>
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<pubDate>Wed, 25 Jul 2012 13:06:12 PDT</pubDate>


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<author>Sinan Müftü</author>


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<title>The Transport of Contaminants in Thin Film Deposition Processes</title>
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<pubDate>Wed, 25 Jul 2012 13:03:26 PDT</pubDate>


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<author>John Cipolla</author>


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<title>Physical Cleaning of Submicron Trenches and Vias</title>
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<pubDate>Wed, 25 Jul 2012 13:00:20 PDT</pubDate>


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<author>Ahmed Busnaina</author>


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<title>Development of New Methods for Locating and Characterizing Defects and Contaminants</title>
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<pubDate>Wed, 25 Jul 2012 12:58:11 PDT</pubDate>


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<author>N. E. Israeloff</author>


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<title>Research Focus at the NSF Center for Nano and Microcontamination Control</title>
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<pubDate>Wed, 25 Jul 2012 12:55:18 PDT</pubDate>


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<author>Ahmed Busnaina</author>


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