Abstract

We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM.

Notes

Originally published in Applied Physics Letters, v.93 no.5 (2008). DOI:10.1063/1.2967855

Keywords

brittleness, ductility, electrical contacts, micromechanical devices, scanning electron microscopy

Subject Categories

Microelectromechanical systems, Electric switchgear, Scanning probe microscopy

Disciplines

Electrical and Electronics | Nanoscience and Nanotechnology

Publisher

American Institute of Physics

Publication Date

2008

Rights Information

Copyright 2008

Rights Holder

American Institute of Physics

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figure1.zip (3901 kB)
Figure 1 - high resolution image

figure2.zip (460 kB)
Figure 2- high resolution image

figure3.zip (99 kB)
Figure 3 - high resolution image

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