Abstract
We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM.
Keywords
brittleness, ductility, electrical contacts, micromechanical devices, scanning electron microscopy
Subject Categories
Microelectromechanical systems, Electric switchgear, Scanning probe microscopy
Disciplines
Electrical and Electronics | Nanoscience and Nanotechnology
Publisher
American Institute of Physics
Publication Date
2008
Rights Information
Copyright 2008
Rights Holder
American Institute of Physics
Permanent URL
Recommended Citation
Chen, L.; McGruer, Nicol E.; Adams, George G.; and Du, Yan, "Separation modes in microcontacts identified by the rate dependence of the pull-off force" (2008). Center for High-Rate Nanomanufacturing Publications. Paper 2. http://hdl.handle.net/2047/d20000886
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figure1.zip (3901 kB)Figure 1 - high resolution image
figure2.zip (460 kB)
Figure 2- high resolution image
figure3.zip (99 kB)
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Notes
Originally published in Applied Physics Letters, v.93 no.5 (2008). DOI:10.1063/1.2967855