Abstract

The successes of making acceptable magnetic properties BaM films by different techniques based on pulsed laser deposition were reported in the past years. The key was to introduce a proper buffer layer to promote two dimensional growths on these semiconductor material substrates. After years, we go back to characterize these samples made by different processings. The purpose of this experiment is to explore the role of the buffer layers especially with the time dependence and thus demonstrate our film suitable for the potential future application. These samples are characterized by scanning electron microscopy, x-ray diffraction, and vibrating sample magnetometry comparing to characteristics of the as deposited films.

Notes

Originally published in Journal of Applied Physics, vol.103, no.7, March 2008. doi: 10.1063/1.2839327

Keywords

Ba-hexaferrite films, semiconductor materials

Subject Categories

Ferrites (Magnetic materials), Thin films--Magnetic properties, Thin films--Effect of temperature on

Disciplines

Chemical Engineering

Publisher

American Institute of Physics

Publication Date

3-2008

Rights Information

Copyright 2008

Rights Holder

American Institute of Physics

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